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Device performance analysis on 20nm technology thin wafers in a 3D package.

Sukeshwar KannanRahul AgarwalArnaud BousquetGeetha AluriHui-Shan Chang
Published in: IRPS (2015)
Keyphrases
  • nm technology
  • power consumption
  • low power
  • integrated circuit
  • software package
  • portable devices
  • computer vision
  • image processing
  • semiconductor manufacturing
  • active contours
  • electron beam
  • power dissipation