Abhishek Koneru

Publication Activity (10 Years)

Years Active: 2015-2022
Publications (10 Years): 17

Top Topics

Built In Self Test

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Mino Woo, Terry Jordan, Robert Schreiber, Ilya Sharapov, Shaheer Muhammad, Abhishek Koneru, Michael James, Dirk Van Essendelft
Disruptive Changes in Field Equation Modeling: A Simple Interface for Wafer Scale Engines. CoRR (2022)
Abhishek Koneru, Krishnendu Chakrabarty
An Interlayer Interconnect BIST and Diagnosis Solution for Monolithic 3-D ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39 (10) (2020)
Abhishek Koneru, Aida Todri-Sanial, Krishnendu Chakrabarty
Reliable Power Delivery and Analysis of Power-Supply Noise During Testing in Monolithic 3D ICs. VTS (2019)
Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty
A Design-for-Test Solution Based on Dedicated Test Layers and Test Scheduling for Monolithic 3-D Integrated Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38 (10) (2019)
Abhishek Koneru, Krishnendu Chakrabarty
Test and Design-for-Testability Solutions for Monolithic 3D Integrated Circuits. ACM Great Lakes Symposium on VLSI (2019)
Abhishek Koneru, Aida Todri-Sanial, Krishnendu Chakrabarty
Power-Supply Noise Analysis for Monolithic 3D ICs Using Electrical and Thermal Co-Simulation. ICECS (2018)
Arunkumar Vijayan, Abhishek Koneru, Saman Kiamehr, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37 (5) (2018)
Abhishek Koneru, Krishnendu Chakrabarty
An inter-layer interconnect BIST solution for monolithic 3D ICs. VTS (2018)
Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty
A Design-for-Test Solution for Monolithic 3D Integrated Circuits. ICCD (2017)
Kyungwook Chang, Abhishek Koneru, Krishnendu Chakrabarty, Sung Kyu Lim
Design automation and testing of monolithic 3D ICs: Opportunities, challenges, and solutions: (Invited paper). ICCAD (2017)
Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty
Impact of Electrostatic Coupling and Wafer-Bonding Defects on Delay Testing of Monolithic 3D Integrated Circuits. ACM J. Emerg. Technol. Comput. Syst. 13 (4) (2017)
Arunkumar Vijayan, Abhishek Koneru, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
Online soft-error vulnerability estimation for memory arrays. VTS (2016)
Abhishek Koneru, Krishnendu Chakrabarty
Analysis of electrostatic coupling in monolithic 3D integrated circuits and its impact on delay testing. ETS (2016)
Farshad Firouzi, Fangming Ye, Arunkumar Vijayan, Abhishek Koneru, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
Re-using BIST for circuit aging monitoring. ETS (2015)
Qing Duan, Abhishek Koneru, Jun Zeng, Krishnendu Chakrabarty, Gary Dispoto
Accurate Analysis and Prediction of Enterprise Service-Level Performance. ACM Trans. Design Autom. Electr. Syst. 20 (4) (2015)
Mehdi Baradaran Tahoori, Abhijit Chatterjee, Krishnendu Chakrabarty, Abhishek Koneru, Arunkumar Vijayan, Debashis Banerjee
Self-awareness and self-learning for resiliency in real-time systems. IOLTS (2015)
Abhishek Koneru, Arunkumar Vijayan, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
Fine-Grained Aging Prediction Based on the Monitoring of Run-Time Stress Using DfT Infrastructure. ICCAD (2015)