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Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress.

Arunkumar VijayanAbhishek KoneruSaman KiamehrKrishnendu ChakrabartyMehdi Baradaran Tahoori
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2018)
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