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Test and Design-for-Testability Solutions for Monolithic 3D Integrated Circuits.
Abhishek Koneru
Krishnendu Chakrabarty
Published in:
ACM Great Lakes Symposium on VLSI (2019)
Keyphrases
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integrated circuit
built in self test
case study
data sets
test cases
software testing
design principles
design methodology
design parameters
test data generation
database
low cost
benchmark problems
experimental design
design space
hardware design