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Design automation and testing of monolithic 3D ICs: Opportunities, challenges, and solutions: (Invited paper).

Kyungwook ChangAbhishek KoneruKrishnendu ChakrabartySung Kyu Lim
Published in: ICCAD (2017)
Keyphrases
  • invited paper
  • design automation
  • test generation
  • technological solutions
  • test cases
  • lessons learned
  • circuit design
  • databases
  • neural network
  • real world
  • computational intelligence
  • computer aided design