Login / Signup

Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers.

Ganesh SrinivasanFriedrich TaenzlerAbhijit Chatterjee
Published in: IEEE Des. Test Comput. (2008)
Keyphrases
  • low cost
  • wireless networks
  • real time
  • low power
  • neural network
  • information systems
  • case study
  • image sequences
  • mobile devices
  • fourier transform
  • statistical tests