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Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probing.
Friedrich Taenzler
Thomas Novak
Erich Kubalek
Published in:
VTS (1993)
Keyphrases
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integrated circuit
electro optic
waveguide
metal oxide semiconductor
synthetic aperture imaging
smart card
automatic target recognition
millimeter wave
electron beam
high quality
denoising