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A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode.
Achintya Halder
Soumendu Bhattacharya
Ganesh Srinivasan
Abhijit Chatterjee
Published in:
VLSI Design (2005)
Keyphrases
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real world
learning environment
databases
neural network
data mining
machine learning
learning algorithm
artificial intelligence
knowledge base
image processing
three dimensional
database systems
evolutionary algorithm
multiresolution