Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications.
Soumendu BhattacharyaAchintya HalderGanesh SrinivasanAbhijit ChatterjeePublished in: J. Electron. Test. (2005)
Keyphrases
- test cases
- software testing
- prediction accuracy
- unit testing
- test generation
- test data
- prediction model
- test sequences
- test suite
- control flow
- testing process
- test case generation
- test data generation
- formal specification
- high accuracy
- usability testing
- information systems
- model based testing
- set of test cases
- regression testing
- prediction error
- statistical tests
- highly accurate
- computationally efficient
- prediction algorithm
- delay insensitive
- database
- test driven development