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Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits.

Ganesh SrinivasanShalabh GoyalAbhijit Chatterjee
Published in: Asian Test Symposium (2004)
Keyphrases
  • analog circuits
  • fault diagnosis
  • digital circuits
  • neural network
  • data sets
  • pattern recognition
  • dynamical systems