Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise.

Rajarajan Senguttuvan Soumendu Bhattacharya Abhijit Chatterjee

Published in: VTS (2008)

Keyphrases

random noise
noise model
highly accurate
median filter
high quality
high accuracy
noise reduction
signal to noise ratio
low signal to noise ratio
functional requirements
formal specification
noise level
data sets
missing data
computationally efficient
image quality
high resolution
high level
image processing