Concurrent Device/Specification Cause-Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures.
Shyam Kumar DevarakondShreyas SenSoumendu BhattacharyaAbhijit ChatterjeePublished in: IEEE Des. Test Comput. (2012)
Keyphrases
- diagnostic reasoning
- model based diagnosis
- medical diagnosis
- medical diagnostic
- differential diagnosis
- diagnostic tests
- disease diagnosis
- critical care
- clinical diagnosis
- fault diagnosis
- monitoring system
- clinically relevant
- diagnostic knowledge
- real time
- diagnostic tool
- model based reasoning
- fault isolation
- hybrid automata
- diagnostic systems
- data acquisition
- bayesian networks
- early diagnosis
- medical devices
- physical activity
- reasoning systems
- diagnostic process
- expert systems
- decision support
- fault diagnostic
- fault detection and diagnosis
- health status
- traditional chinese medicine
- fault localization
- early warning
- specification language
- medical care
- signature verification
- fault detection
- decision making