FAULT DIAGNOSTIC
Experts
- René-Vinicio Sánchez
- Ruqiang Yan
- Krishna R. Pattipati
- Xuefeng Chen
- Chuan Li
- Mourad Elhadef
- Irith Pomeranz
- Fengshou Gu
- Diego Cabrera
- Sudhakar M. Reddy
- Mariela Cerrada
- Hongxia Pan
- Jong-Myon Kim
- Orestes Llanes-Santiago
- Weihua Li
- Silvio Simani
- Srikanth Venkataraman
- Andrew D. Ball
- Pabitra Mohan Khilar
- Yigang He
- Xinyu Li
- Rakesh Ranjan Swain
- Zhongkui Zhu
- Liang Gao
- Ruyi Huang
- Henrik Niemann
- Steven X. Ding
- Chuang Sun
- Heng Zhang
- Krishnendu Chakrabarty
- Yi Lu
- Fangming Ye
- Marios M. Polycarpou
- Tianfu Li
- Seokbae Moon
- Israel Koren
- Rubén Morales-Menéndez
- Sang Woo Kim
- Zhuyun Chen
Venues
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Sensors
- IEEE Trans. Ind. Electron.
- IEEE Trans. Ind. Informatics
- CoRR
- Expert Syst. Appl.
- Eng. Appl. Artif. Intell.
- Entropy
- Reliab. Eng. Syst. Saf.
- ACC
- Neurocomputing
- Adv. Eng. Informatics
- J. Intell. Fuzzy Syst.
- ECC
- IECON
- SAFEPROCESS
- Knowl. Based Syst.
- CASE
- ICPHM
- J. Intell. Manuf.
- I2MTC
- IEEE Trans. Veh. Technol.
- IEEE Trans Autom. Sci. Eng.
- Autom.
- IEEE Internet Things J.
- ITC
- ICNC
- Appl. Soft Comput.
- Appl. Intell.
- ICAC
- Neural Comput. Appl.
- ETFA
- CDC
- ICARCV
- DATE
- IEEE Trans. Computers
- J. Syst. Control. Eng.
- DFT
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