FAULT DIAGNOSTIC
Experts
- René-Vinicio Sánchez
- Chuan Li
- Xuefeng Chen
- Ruqiang Yan
- Krishna R. Pattipati
- Mourad Elhadef
- Srikanth Venkataraman
- Pabitra Mohan Khilar
- Diego Cabrera
- Orestes Llanes-Santiago
- Hongxia Pan
- Jong-Myon Kim
- Weihua Li
- Fengshou Gu
- Mariela Cerrada
- Yigang He
- Silvio Simani
- Andrew D. Ball
- Sudhakar M. Reddy
- Irith Pomeranz
- Zhongkui Zhu
- Chuang Sun
- Rakesh Ranjan Swain
- Heng Zhang
- Ruyi Huang
- Steven X. Ding
- Henrik Niemann
- Liang Gao
- Xinyu Li
- Yongbo Li
- Marios M. Polycarpou
- Barry Dowdeswell
- Xiaoqing Wen
- Hamid A. Toliyat
- Na Qin
- Shruti Patil
- Xiaofei Zhang
- Chunhui Zhao
- Sang Woo Kim
Venues
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Sensors
- IEEE Trans. Ind. Electron.
- CoRR
- IEEE Trans. Ind. Informatics
- Expert Syst. Appl.
- Eng. Appl. Artif. Intell.
- Entropy
- Reliab. Eng. Syst. Saf.
- Neurocomputing
- ACC
- Adv. Eng. Informatics
- ECC
- J. Intell. Fuzzy Syst.
- IECON
- SAFEPROCESS
- Knowl. Based Syst.
- CASE
- IEEE Trans. Veh. Technol.
- I2MTC
- J. Intell. Manuf.
- ICPHM
- IEEE Trans Autom. Sci. Eng.
- Appl. Intell.
- ICAC
- ITC
- ICNC
- IEEE Internet Things J.
- Autom.
- Appl. Soft Comput.
- VLSI Design
- DFT
- CDC
- DATE
- ICARCV
- J. Syst. Control. Eng.
- IEEE Trans. Computers
- ETFA
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