FAULT DIAGNOSTIC
Experts
- René-Vinicio Sánchez
- Mourad Elhadef
- Xuefeng Chen
- Chuan Li
- Ruqiang Yan
- Krishna R. Pattipati
- Silvio Simani
- Sudhakar M. Reddy
- Diego Cabrera
- Andrew D. Ball
- Jong-Myon Kim
- Mariela Cerrada
- Irith Pomeranz
- Weihua Li
- Hongxia Pan
- Yigang He
- Pabitra Mohan Khilar
- Fengshou Gu
- Srikanth Venkataraman
- Orestes Llanes-Santiago
- Chuang Sun
- Heng Zhang
- Rakesh Ranjan Swain
- Henrik Niemann
- Steven X. Ding
- Zhongkui Zhu
- Xinyu Li
- Ruyi Huang
- Liang Gao
- Hamid A. Toliyat
- Deqing Huang
- Lei Shu
- Haidong Shao
- Yu Zhang
- Si-Zhao Joe Qin
- Zhuyun Chen
- Changqing Shen
- Robert X. Gao
- Jipu Li
Venues
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Sensors
- IEEE Trans. Ind. Electron.
- IEEE Trans. Ind. Informatics
- CoRR
- Expert Syst. Appl.
- Eng. Appl. Artif. Intell.
- Entropy
- ACC
- Reliab. Eng. Syst. Saf.
- Neurocomputing
- J. Intell. Fuzzy Syst.
- Adv. Eng. Informatics
- ECC
- IECON
- Knowl. Based Syst.
- SAFEPROCESS
- CASE
- I2MTC
- ICPHM
- IEEE Trans. Veh. Technol.
- J. Intell. Manuf.
- IEEE Trans Autom. Sci. Eng.
- Autom.
- ITC
- Appl. Intell.
- ICAC
- ICNC
- Appl. Soft Comput.
- IEEE Internet Things J.
- VLSI Design
- DATE
- IEEE Trans. Computers
- ETFA
- J. Syst. Control. Eng.
- Neural Comput. Appl.
- DFT
- ICARCV
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