Ramakrishna Voorakaranam

Publication Activity (10 Years)

Years Active: 1997-2007
Publications (10 Years): 0

Publications

Ramakrishna Voorakaranam, Selim Sermet Akbay, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee
Signature Testing of Analog and RF Circuits: Algorithms and Methodology. IEEE Trans. Circuits Syst. I Regul. Pap. (5) (2007)
Sasikumar Cherubal, Ramakrishna Voorakaranam, Abhijit Chatterjee, John McLaughlin, Jason L. Smith, David M. Majernik
Concurrent RF Test Using Optimized Modulated RF Stimuli. VLSI Design (2004)
Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee
Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. ITC (2003)
Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee
A Signature Test Framework for Rapid Production Testing of RF Circuits. DATE (2002)
Ramakrishna Voorakaranam, Abhijit Chatterjee
Test Generation for Accurate Prediction of Analog Specifications. VTS (2000)
Ramakrishna Voorakaranam, Abhijit Chatterjee
Hierarchical Test Generation for Analog Circuits Using Incremental Test Development. VTS (1999)
Ramakrishna Voorakaranam, Abhijit Chatterjee
Feedback Driven Backtrace of Analog Signals and its Application to Circuit Verification and Test. ARVLSI (1999)
Alfred V. Gomes, Ramakrishna Voorakaranam, Abhijit Chatterjee
Modular Fault Simulation of Mixed Signal Circuits with Fault Ranking by Severity. DFT (1998)
Ramakrishna Voorakaranam, Sudip Chakrabarti, Junwei Hou, Alfred V. Gomes, Sasikumar Cherubal, Abhijit Chatterjee, William H. Kao
Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis. ITC (1997)