Hierarchical Test Generation for Analog Circuits Using Incremental Test Development.

Ramakrishna Voorakaranam Abhijit Chatterjee

Published in: VTS (1999)

Keyphrases

test generation
analog circuits
software testing
test cases
quality assurance
test sequences
design automation
mutation testing
symbolic execution
code coverage
static analysis
software engineering
case study
neural network
test data generation
data sets
quality control
relational databases
machine learning