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Concurrent RF Test Using Optimized Modulated RF Stimuli.

Sasikumar CherubalRamakrishna VoorakaranamAbhijit ChatterjeeJohn McLaughlinJason L. SmithDavid M. Majernik
Published in: VLSI Design (2004)
Keyphrases
  • radio frequency
  • relevance feedback
  • neural network
  • database
  • real time
  • machine learning
  • case study
  • probabilistic model
  • test data