Test Generation for Accurate Prediction of Analog Specifications.

Ramakrishna Voorakaranam Abhijit Chatterjee

Published in: VTS (2000)

Keyphrases

test generation
test cases
prediction accuracy
symbolic execution
test sequences
high quality
mutation testing
design automation
quality assurance
software testing
static analysis
data sets
machine vision
pattern matching
feature selection
computer vision
artificial intelligence