Feedback Driven Backtrace of Analog Signals and its Application to Circuit Verification and Test.

Ramakrishna Voorakaranam Abhijit Chatterjee

Published in: ARVLSI (1999)

Keyphrases

analog circuits
digital circuits
fault diagnosis
data driven
test generation
neural network
test cases
model checking
test data
user feedback
circuit design
control system
query language
face verification
analog vlsi
frequency modulation