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Optimized wafer-probe and assembled package test design for analog circuits.
Soumendu Bhattacharya
Abhijit Chatterjee
Published in:
ACM Trans. Design Autom. Electr. Syst. (2005)
Keyphrases
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analog circuits
digital circuits
real time
knowledge base
user interface
fault diagnosis
efficient implementation
case study
design process
pattern matching
engineering design
design methodology
experimental design
software package