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On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST).
Donghoon Han
Selim Sermet Akbay
Soumendu Bhattacharya
Abhijit Chatterjee
William R. Eisenstadt
Published in:
IOLTS (2005)
Keyphrases
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built in self test
integrated circuit
data driven
camera calibration
radio frequency
relevance feedback
focal length
camera parameters
scene structure
specification language
computer vision
closed form
camera motion
high level
formal specification
multi view
viewpoint
euclidean reconstruction
projective camera