PROJECTIVE CAMERA
Experts
- Long Quan
- Atsuhiro Nakamoto
- Eric Hayman
- Hanno Ackermann
- Sing Bing Kang
- Rohan Loveland
- Alessio Del Bue
- Dimitri Bulatov
- Guangyou Xu
- Urs Hugentobler
- Robert Rolland
- Zhihua Wang
- Florian Jacob
- Yasuyuki Sugaya
- Michael Arens
- Joerg Schmalenstroeer
- Baoyong Chi
- Olivier D. Faugeras
- Peter F. Sturm
- Ferran Espuny
- Lourdes Agapito
- Vittorio Murino
- Heung-Yeung Shum
- Fuqian Yang
- Norbert Scherer-Negenborn
- Adlane Habed
- Edward Rosten
- Hanqi Zhuang
- Yusuke Suzuki
- Marco Crocco
- Mahmoud Tavakoli
- Anibal T. de Almeida
- Hanyu Zhu
- Roger Mohr
- Juri Sidorenko
- Ken-ichi Kanatani
- Yanpei Liu
- Lino Marques
- Reinhold Haeb-Umbach
Venues
- CVPR
- Sensors
- CoRR
- IEEE Trans. Instrum. Meas.
- ICCV
- Discret. Math.
- IEEE J. Solid State Circuits
- ISCAS
- Int. J. Comput. Vis.
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IROS
- ICASSP
- ICRA
- Eur. J. Comb.
- Comput. Vis. Image Underst.
- J. Graph Theory
- ROBIO
- ICC
- IEEE Trans. Circuits Syst. II Express Briefs
- IEEE Access
- Des. Codes Cryptogr.
- J. Comb. Theory, Ser. A
- Electron. J. Comb.
- Int. J. Robotics Res.
- ASICON
- IEEE Trans. Pattern Anal. Mach. Intell.
- IGARSS
- ISCAS (1)
- MVA
- IWAENC
- IEEE Trans. Signal Process.
- ECCV (1)
- CAIP
- Adv. Appl. Math.
- VISAPP (1)
- CAD/Graphics
- ICCE-Berlin
- BMVC
- IEEE Trans. Very Large Scale Integr. Syst.
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