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Barry J. Muldrey
ORCID
Publication Activity (10 Years)
Years Active: 2015-2022
Publications (10 Years): 7
Top Topics
Random Number Generator
Data Broadcast
Lightweight
Low Cost
Top Venues
J. Electron. Test.
ICECS
IEEE Trans. Circuits Syst. I Regul. Pap.
ACM Great Lakes Symposium on VLSI
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Publications
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Partha Sarathi Paul
,
Maisha Sadia
,
Md Razuan Hossain
,
Barry J. Muldrey
,
Md Sakib Hasan
Cascading CMOS-Based Chaotic Maps for Improved Performance and Its Application in Efficient RNG Design.
IEEE Access
10 (2022)
Sabyasachi Deyati
,
Barry J. Muldrey
,
Adit D. Singh
,
Abhijit Chatterjee
High Resolution Pulse Propagation Driven Trojan Detection in Digital Systems.
J. Electron. Test.
37 (1) (2021)
Maisha Sadia
,
Partha Sarathi Paul
,
Md Razuan Hossain
,
Barry J. Muldrey
,
Md Sakib Hasan
Design and Application of a Novel 4-Transistor Chaotic Map with Robust Performance.
ICECS
(2021)
Partha Sarathi Paul
,
Maisha Sadia
,
Md Razuan Hossain
,
Barry J. Muldrey
,
Md Sakib Hasan
Design of a Low-Overhead Random Number Generator Using CMOS-based Cascaded Chaotic Maps.
ACM Great Lakes Symposium on VLSI
(2021)
Sabyasachi Deyati
,
Barry J. Muldrey
,
Abhijit Chatterjee
Dynamic Test Stimulus Adaptation for Analog/RF Circuits Using Booleanized Models Extracted From Hardware.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
39 (10) (2020)
Sabyasachi Deyati
,
Barry J. Muldrey
,
Byunghoo Jung
,
Abhijit Chatterjee
Concurrent built in test and tuning of beamforming MIMO systems using learning assisted performance optimization.
ITC
(2017)
Nicholas Tzou
,
Debesh Bhatta
,
Xian Wang
,
Te-Hui Chen
,
Sen-Wen Hsiao
,
Barry J. Muldrey
,
Hyun Woo Choi
,
Abhijit Chatterjee
Concurrent Multi-Channel Crosstalk Jitter Characterization Using Coprime Period Channel Stimulus.
IEEE Trans. Circuits Syst. I Regul. Pap.
(6) (2016)
Nicholas Tzou
,
Debesh Bhatta
,
Barry J. Muldrey
,
Thomas Moon
,
Xian Wang
,
Hyun Woo Choi
,
Abhijit Chatterjee
Low Cost Sparse Multiband Signal Characterization Using Asynchronous Multi-Rate Sampling: Algorithms and Hardware.
J. Electron. Test.
31 (1) (2015)