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Dynamic Test Stimulus Adaptation for Analog/RF Circuits Using Booleanized Models Extracted From Hardware.

Sabyasachi DeyatiBarry J. MuldreyAbhijit Chatterjee
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
  • real time
  • dynamic environments
  • circuit design
  • digital circuits
  • statistical models
  • complex systems
  • processing units
  • analog circuits
  • low cost
  • model selection
  • automatically extracted