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Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal Acquisition.

Thomas MoonHyun Woo ChoiDavid C. KeezerAbhijit Chatterjee
Published in: J. Electron. Test. (2019)
Keyphrases
  • high speed
  • signal acquisition
  • management system
  • expert systems
  • signal processing
  • information systems
  • distributed systems