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BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting.

Shreyas SenAritra BanerjeeVishwanath NatarajanShyam Kumar DevarakondHyun Woo ChoiAbhijit Chatterjee
Published in: J. Electron. Test. (2012)
Keyphrases
  • model fitting
  • least squares
  • parameter estimation
  • shape model
  • active appearance models
  • medical image analysis
  • expectation maximization
  • computer vision
  • evolutionary algorithm
  • probabilistic model