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BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting.
Shreyas Sen
Aritra Banerjee
Vishwanath Natarajan
Shyam Kumar Devarakond
Hyun Woo Choi
Abhijit Chatterjee
Published in:
J. Electron. Test. (2012)
Keyphrases
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model fitting
least squares
parameter estimation
shape model
active appearance models
medical image analysis
expectation maximization
computer vision
evolutionary algorithm
probabilistic model