MODEL FITTING
Experts
- Hanzi Wang
- Guobao Xiao
- David Suter
- Yan Yan
- Feng Ding
- William A. P. Smith
- Jing Na
- Petre Stoica
- Tat-Jun Chin
- Kostas Berberidis
- Igor Djurovic
- Alexander A. Pasko
- Josef Kittler
- Edwin R. Hancock
- Romeo Ortega
- Nikola Bogdanovic
- Thomas Vetter
- Jean Meunier
- Jorge Plata-Chaves
- Björn E. Ottersten
- Bernd Radig
- Maciej Patan
- Rick S. Blum
- Xing Wang
- Irena Hajnsek
- Matthias Wimmer
- Jin Yu
- Freek Stulp
- Dariusz Ucinski
- Gildas Besançon
- Jian Li
- Dimitris N. Metaxas
- Dinggang Shen
- Tosiyasu L. Kunii
- Taotao Lai
- Joseph Tabrikian
- Jitendra K. Tugnait
- Josef A. Nossek
- Yoram Bresler
Venues
- CoRR
- ICASSP
- IEEE Trans. Signal Process.
- IEEE Access
- ACC
- Autom.
- Signal Process.
- Sensors
- CDC
- EUSIPCO
- ICIP
- IGARSS
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Instrum. Meas.
- Remote. Sens.
- Commun. Stat. Simul. Comput.
- ECC
- IEEE Trans. Ind. Electron.
- IEEE Trans. Inf. Theory
- NeuroImage
- IEEE Trans. Medical Imaging
- IEEE Trans. Geosci. Remote. Sens.
- EMBC
- Comput. Stat. Data Anal.
- Comput. Chem. Eng.
- IEEE Trans. Autom. Control.
- ICRA
- Digit. Signal Process.
- Neurocomputing
- Medical Image Anal.
- IEEE Signal Process. Lett.
- IEEE Trans. Aerosp. Electron. Syst.
- Medical Imaging: Image Processing
- ICPR
- WSC
- ICCV
- Pattern Recognit.
- Appl. Math. Comput.
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