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An FPGA-based ATE extension module for low-cost multi-GHz memory test.
David C. Keezer
Te-Hui Chen
Thomas Moon
D. T. Stonecypher
Abhijit Chatterjee
Hyun Woo Choi
Sungyeol Kim
Hosun Yoo
Published in:
ETS (2015)
Keyphrases
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low cost
intel xeon
embedded systems
high speed
test data
memory usage
memory requirements
digital camera
data sets
test cases
random access
memory space