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BIST and production testing of ADCs using imprecise stimulus.

Kumar L. ParthasarathyTurker KuyelDana PriceLe JinDegang ChenRandall L. Geiger
Published in: ACM Trans. Design Autom. Electr. Syst. (2003)
Keyphrases
  • partial information
  • production line
  • production process
  • manufacturing processes
  • database
  • real time
  • test set
  • production planning
  • software testing