Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal.

Le Jin Degang Chen Randall L. Geiger

Published in: IEEE Trans. Instrum. Meas. (2009)

Keyphrases

signal processing
circuit design
sigma delta
frequency domain
low cost
test data
real time
source code
high frequency
radio frequency
low signal to noise ratio
impulse response
data conversion
mixed signal
frequency modulation
printed circuit