Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal.
Le JinKumar L. ParthasarathyTurker KuyelDegang ChenRandall L. GeigerPublished in: IEEE Trans. Instrum. Meas. (2005)
Keyphrases
- signal processing
- circuit design
- error analysis
- frequency modulation
- neural network
- high quality
- low signal to noise ratio
- high accuracy
- printed circuit
- error rate
- error bounds
- blind source separation
- error detection
- data sets
- real time
- analog vlsi
- data conversion
- input signals
- phase locked loop
- digital content
- prediction error
- highly accurate
- frequency domain
- computationally efficient
- high speed