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Unit resistor characterization for matching-critical circuit design.

Yu LinRandall L. Geiger
Published in: ISCAS (2006)
Keyphrases
  • circuit design
  • pattern matching
  • matching algorithm
  • design automation
  • digital circuits
  • feature points
  • keypoints
  • matching process
  • artificial intelligence
  • feature matching
  • image set
  • graph matching
  • affine invariant