FEATURE MATCHING
Experts
- Edwin R. Hancock
- Luc Van Gool
- Jiayi Ma
- Stefano Mattoccia
- Kwanghoon Sohn
- Matteo Poggi
- Marc Pollefeys
- Jiri Matas
- Anil K. Jain
- Marcello Pelillo
- Hongdong Li
- Fabio Tosi
- Amihood Amir
- Richard C. Wilson
- Mohammed Bennamoun
- Kostas Daniilidis
- Andrew Zisserman
- Xiaokang Yang
- Janne Heikkilä
- In-So Kweon
- Seungryong Kim
- Yulan Guo
- Jiaya Jia
- Francesc Serratosa
- Cordelia Schmid
- Anand Rangarajan
- Eddie Cheng
- Junjun Jiang
- Narendra Ahuja
- Thomas S. Huang
- Robert E. L. Aldred
- Adrien Bartoli
- Didier Stricker
- Weihai Chen
- Dongbo Min
- Hujun Bao
- Takafumi Aoki
- Tomás Pajdla
- Josef Kittler
Venues
- CoRR
- CVPR
- ICIP
- ICCV
- ICPR
- IEEE Access
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Sensors
- ICRA
- ICASSP
- Pattern Recognit. Lett.
- IEEE Trans. Image Process.
- IROS
- Remote. Sens.
- BMVC
- IGARSS
- CVPR Workshops
- Image Vis. Comput.
- IEEE Trans. Geosci. Remote. Sens.
- Int. J. Comput. Vis.
- Multim. Tools Appl.
- IEEE Geosci. Remote. Sens. Lett.
- Comput. Vis. Image Underst.
- IEEE Trans. Circuits Syst. Video Technol.
- Discret. Math.
- WACV
- AAAI
- Neurocomputing
- Discret. Appl. Math.
- Vis. Comput.
- IJCAI
- J. Electronic Imaging
- Medical Imaging: Image Processing
- Theor. Comput. Sci.
- EUSIPCO
- SMC
- Mach. Vis. Appl.
- ICME
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