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A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test.
Beatriz Olleta
Hanjun Jiang
Degang Chen
Randall L. Geiger
Published in:
ISCAS (1) (2005)
Keyphrases
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high resolution
low resolution
dynamic environments
matching algorithm
image processing
high quality
super resolution
feature points
high frequency
multispectral
test data
spatial resolution