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Yield enhancement with optimal area allocation for ratio-critical analog circuits.
Yu Lin
Degang Chen
Randall L. Geiger
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2006)
Keyphrases
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analog circuits
optimal allocation
digital circuits
dynamic programming
optimal solution
worst case
high speed
fault diagnosis
wavelet packet transform
image processing
resource allocation
capacity allocation