The SRE/SRM approach for spectral testing of AMS circuits.

Zhongjun Yu Degang Chen Randall L. Geiger

Published in: ISCAS (1) (2004)

Keyphrases

high speed
test cases
image analysis
vlsi circuits
data sets
spatial frequency
spectral analysis
software testing
test data
test set
case study
data mining
databases
test generation
spectral features
database
introducing additional