On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering.

Hanqing Xing Degang Chen Randall L. Geiger

Published in: EIT (2008)

Keyphrases

high speed
high resolution
frame rate
spatial resolution
low power
low resolution
super resolution
image processing
real time
high frequency
high speed networks
field of view
sonar images
remote sensing
test cases
image compression
high resolution images
power dissipation
focal plane
face images