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High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy.
Hanqing Xing
Hanjun Jiang
Degang Chen
Randall L. Geiger
Published in:
IEEE Trans. Instrum. Meas. (2009)
Keyphrases
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high resolution
low resolution
remote sensing
image generation
super resolution
high frequency
image processing
field of view
image analysis
high quality
three dimensional
data sets
satellite images
magnetic resonance images
digital content
optimal strategy
digital media
low resolution images