A cost-effective histogram test-based algorithm for digital calibration of high-precision pipelined ADCs.
Xin DaiDegang ChenRandall L. GeigerPublished in: ISCAS (5) (2005)
Keyphrases
- cost effective
- high precision
- computational complexity
- detection algorithm
- high accuracy
- high recall
- np hard
- worst case
- dynamic programming
- cost function
- objective function
- probabilistic model
- convergence rate
- preprocessing
- optimal solution
- segmentation algorithm
- optimization algorithm
- genetic algorithm
- digital straight line
- matching algorithm
- multi view
- simulated annealing
- k means
- search space
- learning algorithm