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A Simulator of Small-Delay Faults Caused by Resistive-Open Defects.

Alejandro CzutroNicolas HouarchePiet EngelkeIlia PolianMariane ComteMichel RenovellBernd Becker
Published in: ETS (2008)
Keyphrases
  • small number
  • fault diagnosis
  • real world
  • database
  • fault detection
  • machine learning
  • genetic algorithm
  • search engine
  • computer vision
  • multi agent systems
  • test cases
  • model based diagnosis
  • small size
  • defect detection