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A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs.
Vincent Kerzerho
Philippe Cauvet
Serge Bernard
Florence Azaïs
Mariane Comte
Michel Renovell
Published in:
IEEE Des. Test Comput. (2006)
Keyphrases
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complex data
high level
test cases
frequency domain
complex systems
database
machine learning
information retrieval
learning algorithm
artificial intelligence
computer vision
artificial neural networks
higher level