Low-cost phase noise testing of complex RF ICs using standard digital ATE.

Stephane David-Grignot Florence Azaïs Laurent Latorre Francois Lefevre

Published in: ITC (2014)

Keyphrases

low cost
higher level
low power
case study
radio frequency
neural network
real world
computer vision
multimedia
high level
database systems
data structure
lightweight
complex data
single chip