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On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST.

Serge BernardFlorence AzaïsYves BertrandMichel Renovell
Published in: J. Electron. Test. (2003)
Keyphrases
  • built in self test
  • low cost
  • high speed
  • single chip
  • high density
  • wave propagation
  • neural network
  • physical design
  • vlsi design
  • generation process
  • vlsi implementation