On the Detection of SSN-Induced Logic Errors through On-Chip Monitoring.
Florence AzaïsLaurent LarguierYves BertrandMichel RenovellPublished in: IOLTS (2008)
Keyphrases
- automatic detection
- object detection
- low cost
- detection rate
- detection method
- chip design
- detection algorithm
- monitoring system
- detection accuracy
- false alarms
- anomaly detection
- face detection
- false positives
- decision support
- high speed
- modal logic
- circuit design
- programmable logic
- event detection
- random access memory
- analog vlsi
- real time