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Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective Accelerometers.

Ahmed Amine RekikFlorence AzaïsFrédérick MaillyPascal Nouet
Published in: J. Electron. Test. (2014)
Keyphrases
  • low cost
  • low power
  • data sets
  • learning algorithm
  • empirical studies
  • experimental design
  • multiple choice
  • structural equation modeling