Impact of Simultaneous Switching Noise on the Static behavior of Digital CMOS Circuits.
Florence AzaïsLaurent LarguierMichel RenovellPublished in: ATS (2007)
Keyphrases
- circuit design
- high speed
- analog vlsi
- mixed signal
- delay insensitive
- tunnel diode
- vlsi circuits
- low cost
- dynamic analysis
- low power
- power consumption
- noise reduction
- signal to noise ratio
- noise model
- digital circuits
- noise level
- cmos technology
- human behavior
- random access memory
- random noise
- focal plane
- noisy data
- wide dynamic range
- multiscale
- low voltage
- power dissipation
- noise free
- noisy environments