Generic simulator for faulty IC.

Julie Ferrigno Aziz Machouat Philippe Perdu Dean Lewis Gérald Haller Vincent Goubier

Published in: Microelectron. Reliab. (2008)

Keyphrases

integrated circuit
domain specific
high level
fault diagnosis
expert systems
real time
genetic algorithm
information systems
image sequences
multi agent
object recognition
special case
simulation environment
generic model