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Characterization and Modeling of Gate-Induced-Drain-Leakage.

Fabien GilibertDenis RideauAlexandre DrayFrancois AgutMichel MinondoAndre JugePascal MassonRachid Bouchakour
Published in: IEICE Trans. Electron. (2005)
Keyphrases
  • early warning
  • neural network
  • nano scale
  • real time
  • databases
  • genetic algorithm
  • multiresolution
  • modeling framework