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Improvement of MOSFET matching characterization with calibrated multiplexed test structure.
Loic Welter
J. L. Scotto di Quaquero
Philippe Dreux
Laurent Lopez
Hassen Aziza
Jean-Michel Portal
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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matching algorithm
geometric structure
real time
multi view
pattern matching
structural properties
affine invariant
matching scheme