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Back-end soft and hard defect monitoring using a single test chip.
Fabrice Rigaud
Jean-Michel Portal
Hassen Aziza
Didier Née
Julien Vast
Fabrice Argoud
Bertrand Borot
Published in:
Microelectron. Reliab. (2011)
Keyphrases
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back end
user friendly
data management
building blocks
data types
version control
low cost
monitoring system
real time
high speed
test data
built in self test
database
defect detection
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databases