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True random number generation exploiting SET voltage variability in resistive RAM memory arrays.
Jérémy Postel-Pellerin
Hussein Bazzi
Hassen Aziza
Pierre Canet
Mathieu Moreau
Vincenzo Della Marca
Adnan Harb
Published in:
NVMTS (2019)
Keyphrases
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random number
neural network
random number generator
data sets