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True random number generation exploiting SET voltage variability in resistive RAM memory arrays.

Jérémy Postel-PellerinHussein BazziHassen AzizaPierre CanetMathieu MoreauVincenzo Della MarcaAdnan Harb
Published in: NVMTS (2019)
Keyphrases
  • random number
  • neural network
  • random number generator
  • data sets